By Topic

Single fault location in a linear analogue system with variable sensitivity matrix

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Tong, K.Y. ; Hong Kong Polytechnic, Department of Electronic Engineering, Kowloon, Hong Kong

A method of locating a single fault in a linear analogue system by determining the consistency of the inaccessible nodal voltage vectors is proposed. It does not require the assumption of an invariable sensitivity matrix, and can thus be applied to catastrophe faults as well.

Published in:

Electronics Letters  (Volume:16 ,  Issue: 6 )