By Topic

New diffraction grating profiles in InP for DFB lasers and integrated optics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Westbrook, L.D. ; British Telecom Research Laboratories, Ipswich, UK ; Nelson, A.W. ; Fiddyment, P.J.

A bilevel processing technique has been used to obtain sub-micrometer-period InP diffraction gratings. Novel cross-sectional grating profiles with depths of up to 4000 Å have been obtained which should facilitate the fabrication of more efficient Bragg devices.

Published in:

Electronics Letters  (Volume:19 ,  Issue: 25 )