By Topic

Imaging spatial distributions of resistivity using applied potential tomography

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $33
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
C. C. Barber ; Sheffield University and Area Health Authority Royal Hallamshire Hospital, Department of Medical Physics & Clinical Engineering, Sheffield, UK ; B. H. Brown ; I. L. Freeston

A method of obtaining images of electrical resistivity is described. It uses measurements of voltage differences on the periphery of the region to be imaged, and a reconstruction method using backprojection. An image of a human forearm is presented.

Published in:

Electronics Letters  (Volume:19 ,  Issue: 22 )