Cart (Loading....) | Create Account
Close category search window
 

Integration decrement method for measuring Q of microwave resonators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Kneppo, I. ; Elektrotechnickÿ ústav CEFV SAV, Bratislava, Czechoslovakia

The integration of the exponential decay curve of the damped oscillating microwave resonator is proposed as a tool to measure the resonator quality factor. This modification of the decrement method was verified experimentally in the X-band test Set.

Published in:

Electronics Letters  (Volume:19 ,  Issue: 13 )

Date of Publication:

June 23 1983

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.