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Unloaded quality factor measurement for MIC dielectric resonator applications

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3 Author(s)
Podcameni, A. ; CETUC-Universidade Catolica, Rio de Janeiro, Brazil ; Conrado, L.F.M. ; Mosso, M.M.

The unloaded quality factor of a dielectric resonator, in the MIC environment, and magnetically coupled to a terminated microstrip line, is estimated by using a network analyser. It is sufficient to compute the relative bandwidth of the interception between the reflection coefficient locus and the R ¿ 1 = ±jX arcs.

Published in:

Electronics Letters  (Volume:17 ,  Issue: 18 )

Date of Publication:

September 3 1981

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