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Fault detection in combinational circuits using Gunn effect logic devices

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2 Author(s)
K. K. Saluja ; University of Newcastle, Department of Electrical & Computer Engineering, Newcastle, Australia ; F. J. Lidgey

It is shown that certain realisations of combinational switching functions using Gunn effect logic gates can be tested for single or multiple stuck-type faults by using two tests only. This result is achieved by exploiting the fact that the function of Gunn effect logic gates is sensitive to bias voltage

Published in:

Electronics Letters  (Volume:17 ,  Issue: 6 )