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Early voltage uniqueness test for bipolar junction transistors

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1 Author(s)
B. L. Hart ; North East London Polytechnic, Faculty of Engineering, Dagenham, UK

A technique is described for the direct visual comparison of the common emitter output characteristic¿at a chosen collector current, in the forward active mode¿of a junction transistor subjected alternately to base-emitter voltage drive and base current drive. The Early effect is characterised by a unique parameter, the Early voltage, only if the two curves can be shown to exhibit coincidence in the nonsaturated region.

Published in:

Electronics Letters  (Volume:16 ,  Issue: 18 )