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Refracted power technique for cutoff wavelength measurement in single-mode waveguides

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4 Author(s)
Bhagavatula, V.A. ; Corning Glass Works, Corning, USA ; Love, W.F. ; Keck, D.B. ; Westwig, R.A.

A technique to measure the local (2¿3 mm) values of cutoff wavelength ¿c in single-mode waveguides is described. The technique, insensitive to the length of waveguide used, involves the spectral measurement of refracted power. The feasibility of using the cutoff wavelength determined by this technique to predict the zero dispersion wavelength is also studied.

Published in:

Electronics Letters  (Volume:16 ,  Issue: 18 )