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Photo-f.e.t. method: high-resolution deep-level measurement technique using a m.e.s.f.e.t. structure

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2 Author(s)
F. J. Tegude ; University of Duisburg, Solid State Electronics Department, FB9, Duisburg, West Germany ; K. Heime

M.E.S.F.E.T.s with channels produced by diffusion from spun-on emulsion films into semi-insulating GaAs were investigated by a new technique: the photo-f.e.t. method. The advantage over the commonly used photocapacitance method is outlined and measurements are presented.

Published in:

Electronics Letters  (Volume:16 ,  Issue: 1 )