Cart (Loading....) | Create Account
Close category search window

Nondestructive refractive-index profile measurement of elliptical optical fibre or preform

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Chu, P.L. ; University of New South Wales, School of Electrical Engineering, Kensington, Australia

A nondestructive method of determining the refractive-index profile of an elliptic optical fibre or preform is reported. For the fibre, the pathlength data obtained from interference microscopic measurement are used. For the preform, the ray exit angles are used. These data are put into an integral that can be inverted numerically to obtain the reconstructed profile.

Published in:

Electronics Letters  (Volume:15 ,  Issue: 12 )

Date of Publication:

June 7 1979

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.