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Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure

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5 Author(s)
Mukhopadhyay, S. ; IBM T. J. Watson, Yorktown Heights, NY ; Keunwoo Kim ; Jenkins, K.A. ; Ching-Te Chuang
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An on-chip digital characterization method for local random variation in a process is presented. The method uses a sense-amplifier-based test circuit that uses digital voltage measurement instead of the analog current measurements of conventional techniques. The proposed circuit helps design fast on-chip built-in-self-test schemes for measuring random variation. A testchip is designed in 0.13mum CMOS and measured to show the effectiveness of the proposed circuit in extracting local random variation.

Published in:

Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International

Date of Conference:

11-15 Feb. 2007