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Refractive-index profiles of stress-induced (embossed) optical waveguides

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1 Author(s)
Sabine, P.V.H. ; Telecom Australia, Research Laboratories, Melbourne, Australia

Low-loss stress-induced light guides have been fabricated by an embossing process. The results of interferometric and near-field scan measurements of the refractive index profile of these waveguides are presented.

Published in:

Electronics Letters  (Volume:13 ,  Issue: 2 )

Date of Publication:

January 20 1977

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