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A method for characterising a coaxial-to-microstrip connector at X-band frequencies in terms of 5 parameters is given. The technique involves measurements on various lengths of open-circuited 50 Â¿ lines on alumina substrates. Knowledge of the effective relative permittivity at each frequency of measurement is required, and this is obtained from measured data of the input reflection coefficient.
Date of Publication: August 19 1976