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An optical method using a laser and an integrating sphere combination for characterizing the thickness profile of magnetic media

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4 Author(s)
Leung, W.C. ; IBM Corp., San Jose, CA, USA ; Crooks, W. ; Rosen, H. ; Strand, T.

An optical instrument developed for measuring the film thickness of magnetic media is described. The system uses a polarized-laser beam and an integrating sphere to measure the absorption by the magnetic media. The film thickness is calculated from the absorption value in real time by using a personal computer. The corresponding radial and azimuthal positions for the measurement are determined from a computerized R-θ (rotational-translational) stage. The automated instrument, which rapidly maps the film thickness of particulate and thin-film media, has provided the first full-disk image of film thickness variation

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Magnetics, IEEE Transactions on  (Volume:25 ,  Issue: 5 )