Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Extension of Boolean differentiation to define a test for a specific logic fault in a combinational logic network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Prior, A.C ; University of Southampton, Department of Electronics, Southampton, UK

The letter demonstrates an extension of Boolean difference to obtain a test for a specific fault. The extension is compared with Roth's D calculus, and it is shown that the two concepts are complementary. A procedure for determining the total fault-detection capability of each test is indicated.

Published in:

Electronics Letters  (Volume:10 ,  Issue: 17 )