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Correction of microwave-network-analyser measurements of 2-port devices

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1 Author(s)
Davies, O.J. ; University College London, Department of Electronics & Electrical Engineering, London, UK

Explicit expressions are presented for the correction of the scattering parameters of 2-port devices when measured by a microwave network analyser. The expressions avoid the necessity for iterative methods, and hence improve the computational efficiency and simplify programming when applied to an automated network analyser.

Published in:

Electronics Letters  (Volume:9 ,  Issue: 23 )

Date of Publication:

November 15 1973

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