By Topic

Small-signal noise analysis of p+--n--p+ BARITT diodes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sjölund, A. ; Microwave Institute Foundation, Stockholm, Sweden

The noise sources in BARITT diodes are described. The noise measure is calculated numerically and compared with experimental results. The optimum noise measure at 8 GHz was determined by varying the device width for given current density and doping density. The best noise measure of 9 dB was obtained for a doping of 2.5 x 1015/cm3 and a current density of 60 A/cm2.

Published in:

Electronics Letters  (Volume:9 ,  Issue: 1 )