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Surface-resistance measurements of thin conducting films at 10 GHz

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2 Author(s)
Butlin, R.S. ; University of Warwick, Department of Engineering, Coventry, UK ; McPhun, M.K.

The letter describes a technique for calibration of an H011 cavity for surface-resistance measurements of thin-film and bulk samples at 10 GHz. After calibration and insertion of the sample, it is only necessary to measure the return loss or v.s.w.r. at resonance. The conductivity and surface resistance of the sample may then be read directly from a graph.

Published in:

Electronics Letters  (Volume:8 ,  Issue: 26 )