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Noise and distortion considerations in charge-coupled devices

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1 Author(s)
Barbe, D.F. ; Naval Research Laboratory, Washington, USA

Noise and distortion considerations for charge-coupled devices used in imaging applications are presented. Distortion occurs because of transfer inefficiency and leakage current. Noise contributions due to thermal noise during the formation of the potential wells, shot noise in the leakage current and interface-state noise are discussed.

Published in:

Electronics Letters  (Volume:8 ,  Issue: 8 )