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Browse Journals & Magazines > Electronics Letters ...> Volume:6 Issue:24 Help

Possible relation between the low-level attenuation constant or ΔHeff and ΔHk

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2 Author(s)
Ogasawara, N. ; Tokyo Metropolitan University, Tokyo, Japan ; Sawado, E.

It is deduced from a theoretical model that the effective linewidth or low-level attenuation constant increases in proportion to the reciprocal of the spin-wave linewidth when the latter exceeds a certain minimum.

Published in:
Electronics Letters  (Volume:6 ,  Issue: 24 )

Date of Publication: November 26 1970

ISSN :
0013-5194
Digital Object Identifier :
10.1049/el:19700526
Product Type:
Journals & Magazines
Date of Current Version :
11 July 2007
Issue Date :
November 26 1970
Sponsored by :
Institution of Engineering and Technology

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