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Read and write characteristics of Co-Ni-Zr-M/Cr thin films for longitudinal recording

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6 Author(s)

The magnetic and crystallographic properties and read and write characteristics of sputtered C/Co-Ni-Zr/Cr and C/Co-Ni-Zr-M/Cr (M=V, Nb, Ta, Cr, Mo, W, Cu, Si, Al, Ru and Pt) thin films are investigated. The saturation magnetic flux density Bs of all C/Co-Ni-Zr-M/Cr films decreases as the amount of additive element increases. The coercivity of C/Co-Ni-Zr-Cr/Cr and C/Co-Ni-Zr-Pt/Cr is higher than that of C/Co-Ni-Zr/Cr films with comparable Bs . The larger the perpendicular anisotropy Kp and the smaller the anisotropy constant Kn, the lower the media noise N and the higher the S/N ratio. The reduction of Kn and N are strongly connected to grain separation and grain size reduction. The larger the Bs·tmag, the higher EII and N and the lower D 50 and the S/N ratio. All films except those with Si, Ru, and Pt additives have large Kp, a small Kn, and a high S/N ratio. In particular, C/Co-Ni-Zr-M/Cr (M=Cr, Mo, W, and Al) disks have a better S/N ratio and D50 than C/Co-Ni-Zr/Cr disks

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IEEE Transactions on Magnetics  (Volume:25 ,  Issue: 5 )