Cart (Loading....) | Create Account
Close category search window

Multiple Sclerosis Diagnosis Based on Analysis of Subbands of 2-D Wavelet Transform Applied on MR-images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Torabi, M. ; Sharif Univ. of Technol., Tehran ; Moradzadeh, H. ; Vaziri, R. ; Ardekani, R.D.
more authors

In this study, we have proposed a novel approach to investigate the features of four subbands of 2-D wavelet transform in magnetic resonance images (MRIs) for normal and abnormal brains which defected by multiple sclerosis (MS). Concurrently, another method extracts different kinds of features in spatial domain. Totally, 116 features have been extracted. Before applying the algorithm, we have to use a registration method because of variety in size of brain images. All extracted features have been passed over the principal component analysis (PCA) and have been pushed to an artificial neural network (ANN) that is a feed-forward type. According to changing in position of defected parts of brain, we have analyzed four different MRI datasets in different stages of MS progression, including 101 MRIs of normal and abnormal brain images. In all cases, certain diagnosis is gained. Meantime, 40 percent of the datasets have been reserved as the "test data ".

Published in:

Computer Systems and Applications, 2007. AICCSA '07. IEEE/ACS International Conference on

Date of Conference:

13-16 May 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.