Cart (Loading....) | Create Account
Close category search window
 

Rapid Prototyping of Intrusion Detection Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kordon, F. ; Université Pierre, France ; Voron, J.-B. ; Iftode, L.

Designing security softwares that evolve as quickly as threats is a truthful challenge. In addition, current software becomes increasingly more complex and difficult to handle even for security experts. Intrusion Detection Softwares (IDS) represent a solution that can alleviate these concerns. This paper proposes a framework to automatically build an effective online IDS which can check if the program's expected behavior is respected during the execution. The proposed framework extracts relevant information from the program's source code to build a dedicated IDS. We use the GCC compiler to produce the structure of our behavior's model and ensure the IDS is correct. Thanks to Petri nets, our framework allows program offline monitoring and simplifies the online monitoring development.

Published in:

Rapid System Prototyping, 2007. RSP 2007. 18th IEEE/IFIP International Workshop on

Date of Conference:

28-30 May 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.