Referenced Items are not available for this document.
This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.
Published in:
Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Date of Conference: 15-19 April 2007
- Page(s):
- 520 - 525
- E-ISBN :
- 1-4244-0919-5
- Print ISBN:
- 1-4244-0919-5
- INSPEC Accession Number:
- 9573494
- Conference Location :
- Phoenix, AZ
- Digital Object Identifier :
- 10.1109/RELPHY.2007.369945
- Product Type:
- Conference Publications
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