Cart (Loading....) | Create Account
Close category search window

A Cross-Layer Approach to Contour Nodes Inference with Data Fusion in Wireless Sensor Networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Pei-Kai Liao ; Dept. of Electr. Eng., Southern California Univ., Los Angeles, CA ; Min-Kuan Chang ; Kuo, C.-C.J.

A cross-layer approach to contour nodes inference of monitored physical phenomena with data fusion in wireless sensor networks is investigated in this work. The authors first analyze three sources of signal distortion: sensing noise, data quantization error and data communication noise. The sensing noise is often negligible. We need to choose the proper data quantization levels to balance the communication cost and the desired signal quality. Besides, data fusion at a local fusion center can be used to mitigate the communication noise due to the poor wireless channel. Instead of making a hard binary decision, the probability for a sensor node to be a contour node is calculated at the local fusion center. An adaptive data fusion scheme is proposed to avoid excessive packet retransmissions. Simulation results are given to show the effects of different system parameters on the overall system performance.

Published in:

Wireless Communications and Networking Conference, 2007.WCNC 2007. IEEE

Date of Conference:

11-15 March 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.