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In this paper we present fault tolerant CMOS logic using redundancy and ternary signals. The ternary gates are implemented using recharge logic which can be exploited in binary and multiple-valued logic (MVL). Signals are processed through capacitors in such a way that the logic operation of a gate is independent of the DC voltage applied on the inputs. By combining signals through capacitors stuck on/stuck off and stuck at faults are not destructive when redundancy is applied. Simulated data for 130 nm and 0.35 mum CMOS processes are given.
Date of Conference: 13-16 May 2007