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The following topics are dealt with: integrated circuit design; integrated circuit testing; design automation; design for testability for SoCs; performance modelling and synthesis of analogue/mixed-signal circuits; system level mapping and simulation; IP designs for media processing; microprocessors in era of terascale integration; statistical/nonlinear analysis and verification for analogue circuits; nano-technologies for reconfigurable computing; LDPC codecs for communication standards; NoCs testing; automatic synthesis of computation intensive application specific circuits; automotive applications; test generation for diagnosis, scan testing and advanced memory fault models; process aware low power circuit design; hardware implementation of MPSoCs and NoCs architectures; ubiquitous communication and computation; industrial system designs in aerospace, avionics and automotive; mixed-signal and RF test; power management; embedded processors design; nano and FIFO; system level validation; model-based design for embedded systems; resource optimisation for best effort and quality of service; designs in avionics, military and space; timing analysis; middleware; secure systems; reliable microarchitectures; formal verification; interconnect extraction and synthesis; placement and floorplanning; crypto blocks and security; variation tolerant mixed signal test; SAT techniques for verification; compiler techniques for customisable architectures; interconnect optimization and metastability; physical and device simulation; wireless communication and networking system implementation; soft error evaluation; memory and instruction-set customization for real-time systems; order reduction and variation-aware interconnect modelling; system reliability; statistical timing and worst-delay corner analysis

Published in:

Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07

Date of Conference:

16-20 April 2007