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Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary

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4 Author(s)
Wei Zou ; Mentor Graphics Corp., Wilsonville, OR ; Wu-Tung Cheng ; Reddy, S.M. ; Huaxing Tang

In this paper we present a new technique to speed up the effect-cause defect diagnosis by using a dictionary of very small size. In the proposed method, a dictionary of small size is used to reduce the number of events (gate evaluations) during the simulation of failing patterns and also a procedure to select a subset of passing patterns for simulation. Although the dictionary size is smaller, experimental results show speed up of effect-cause diagnosis by up to 156times. Experimental results from industrial designs validate the effectiveness of the proposed method.

Published in:

VLSI Test Symposium, 2007. 25th IEEE

Date of Conference:

6-10 May 2007