Cart (Loading....) | Create Account
Close category search window

Two novel automatic frequency tracking loops

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Anguirre, S. ; Motorola, Chandler, AZ, USA ; Hinedi, S.

Two automatic-frequency-control loops are introduced and analyzed in detail. The algorithms are generalizations of the well-known cross-product automatic-frequency-control loop with improved performance. The first estimator uses running overlapping discrete Fourier transforms (DFTs) to create a discriminator curve proportional to the frequency estimation error, whereas the second one preprocesses the received data and then uses an extended Kalman filter to estimate the input frequency. The algorithms are tested by computer simulations in a low carrier-to-noise-ratio (CNR) and highly dynamic environment. The algorithms are suboptimum tracking schemes with a larger frequency error variance compared to an optimum strategy, but they offer simplicity of mechanization and a CNR with a very low operating threshold

Published in:

Aerospace and Electronic Systems, IEEE Transactions on  (Volume:25 ,  Issue: 5 )

Date of Publication:

Sep 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.