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In order to improve the testability of asynchronous NoCs, we have developed a design-for-test (DfT) architecture. In this architecture, each asynchronous network node is surrounded by an asynchronous test wrapper and the network communication channels are reused to establish high throughput TAMs. A special block, the generator-analyzer-controller (GAC) unit, has also been developed to generate test vectors, to control test flows, and to analyze the test results. This unit can be implemented on-chip or off-chip (in our experiments, it has been implemented off-chip). The operation of the test wrappers is controlled by a dedicated 2-bit configuration channel. Thanks to its scalability and versatility, the proposed architecture can be configured to adapt to any NoC topology and to any specific application.