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Computer Guided Logic IC Fault Location

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1 Author(s)
Rauwerdink, Jeffrey L. ; Harris Semiconductor, Custom Integrated Circuits Division, P. O. Box 883, MI/S 52-010, Melbourne, FL 32901. Tel. (305) 729-5833

A new technique locates `stuck' faults in semicustom logic ICs (integrated circuits) using a PC (printed circuit) board functional tester which has a guided-probe fault location capability. The IC CAD (computer aided design) database, database translator programs and a logic simulator are utilized to automate the fault site location process This technique is in use on a set of 15 gate arrays.

Published in:

Reliability Physics Symposium, 1987. 25th Annual

Date of Conference:

April 1987