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The use of Marginal Voltage Measurements to Detect and Locate Defects in Digital Microcircuits

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2 Author(s)
D J Ager ; British Telecom Research Laboratories, Martlesham Heath, Ipswich IP5 7RE England ; J C Henderson

By combining a measurement of the supply voltages below which a digital integrated circuit misoperates during a functional test, and a lightspot scanning technique, it is shown how defects can be both detected and located in circuits which otherwise appear normal. Equipment is described and examples are given of defects found.

Published in:

Reliability Physics Symposium, 1981. 19th Annual

Date of Conference:

April 1981