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Predicting mixed-signal dynamic performance using optimised signature-based alternate test

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4 Author(s)
Kim, B. ; Comput. Eng. Res. Center, Univ. of Texas, TX ; Shin, H. ; Chun, J.-H. ; Abraham, J.A.

Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships between signatures and specification. In addition, it is difficult to precisely control physical factors in built-in self-test circuitry, which can cause errors in the signatures. A methodology for efficient prediction of circuit specifications with optimised signatures has been proposed. The proposed optimised signature-based alternate test methodology accurately predicts the specifications of a Device Under Test (DUT) using a strong correlation mapping function. Hardware measurement results show that this approach can be effectively used to predict the specifications of a DUT, with a significant reduction in the prediction error compared with previous approaches

Published in:

Computers & Digital Techniques, IET  (Volume:1 ,  Issue: 3 )