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Modeling of the mechanical behavior during programming of a non-volatile phase-change memory cell using a coupled electrical-thermal-mechanical finite-element simulator

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5 Author(s)
Thomas Gille ; IMEC, Kapeldreef 75, 3001 Leuven, Belgium; ESAT/INSYS, KU Leuven, Kasteelpark Arenberg 10, 3001 Leuven, Belgium ; Judit Lisoni ; Ludovic Goux ; Kristin De Meyer
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During programming of a phase-change memory cell, the material is locally heated up to high temperatures (>600degC), to induce phase transitions as crystallization (SET) or amorphization by quenched cooling (RESET). In this work, the thermo-mechanical stresses induced in a line-type phase-change memory cell were examined using electrical-thermal-mechanical coupled finite-element simulation. Specific procedures are described, for implementing particular mechanical characteristics of the phase-change material, i.e. the volume change on crystallization, the relaxation and the phase-dependent Young moduli. Their respective effects during SET and RESET programming are investigated.

Published in:

2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007

Date of Conference:

16-18 April 2007