By Topic

Frequency Domain Analysis for Dynamic Nonlinearity Measurement in A/D Converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Adamo, F. ; Dept. of Electrics & Electron., Polytech. of Bari ; Attivissimo, F. ; Giaquinto, N. ; Kale, I.

This paper discusses the problem of measuring the dynamic systematic error or the dynamic input-output characteristic of an analog-to-digital converter (ADC) stimulated by a sinusoidal input. First of all, it is shown that the statistical methods, although widely used, yield misleading results in dynamic conditions, i.e., when the converter characteristic presents hysteresis. Second, this paper presents a modified version of a frequency-domain method (Chebyshev test), previously developed by the authors for testing static devices. Both simulation and experimental results show that the Chebyshev test for dynamic nonlinearities is a very fast way to measure the input-output characteristic of an ADC affected by hysteresis error

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:56 ,  Issue: 3 )