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Study on Interconnect Test Generation ofMCM based on Particle Swarm Optimization Algorithm

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1 Author(s)
Lei Chen ; Dept. of Comput. Sci., Guilin Univ. of Electron. Technol.

With rapid development of very large scale integration (VLSI), multichip module (MCM) and multilayer printed circuit boards (MPCB), interconnect test technology has become a bottleneck in the application of these circuits. This paper presents a novel optimized approach based on particle swarm optimization (PSO) algorithm for MCM interconnect test generation. By combing the characteristics of interconnect test and constructing particle expression of test generation, the velocity updating equation and position updating equation of discrete PSO is designed for MCM in this paper. The optimized search is guided by the swarm intelligent generated from cooperation and competition among particles of swarm. The experimental results for benchmark circuits show that the proposed algorithm can achieve compact test set, high fault coverage and short CPU time when compared to other interconnect test generation algorithms

Published in:

Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on

Date of Conference:

26-29 Aug. 2006