Cart (Loading....) | Create Account
Close category search window
 

Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fawnizu Azmadi Hussin ; Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Kansai Science ; Yoneda, T. ; Orailoglu, A. ; Fujiwara, H.

An integrated test scheduling methodology for multiprocessor system-on-chips (SOC) utilizing the functional buses for test data delivery is described. The proposed methodology handles both flat bus single processor SOC and hierarchical bus multiprocessor SOC. It is based on a resource graph manipulation and a packet-based packet set scheduling methodology. The resource graph is decomposed into a set of test configuration graphs, which are then used to determine the optimum test configurations and test delivery schedule under a given power constraint. In order to validate the effectiveness of the proposed methodology, a number of experiments are run on several modified benchmark circuits. The results clearly underscore the advantages of the proposed methodology.

Published in:

Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific

Date of Conference:

23-26 Jan. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.