Referenced Items are not available for this document.
Analog circuit sizing under process/parameter variations is formulated as a mini-max geometric programming problem. To tackle such problem, we present a new method that combines the ellipsoid method and affine arithmetic. Affine arithmetic is not only used for keeping tracks of variations and correlations, but also helps to determine the sub-gradient at each iteration of the ellipsoid method. An example of designing a CMOS operational amplifier is given to demonstrate the effectiveness of the proposed method. Finally numerical results are verified by SPICE simulation.
Published in:
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Date of Conference: 23-26 Jan. 2007
- Page(s):
- 203 - 208
- E-ISBN :
- 1-4244-0630-7
- Print ISBN:
- 1-4244-0629-3
- INSPEC Accession Number:
- 9562946
- Conference Location :
- Yokohama
- Digital Object Identifier :
- 10.1109/ASPDAC.2007.357986
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