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Series-Coupling Test Characterization of On-chip Silicon-Integrated and PWB-Integrated Transformers

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4 Author(s)
Hayes, J.G. ; University College Cork, Ireland. john.hayes@ucc.ie ; Egan, M.G. ; Ningning Wang ; O'Donnell, T.

On-chip silicon-integrated and PWB-integrated transformers are currently being developed for signal and power applications in high-frequency power supplies. Prototype transformers feature relatively high winding resistances, core loss, and leakage inductances compared to conventional transformers. Short-circuit tests have limited use for characterizing these prototype high-parasitic transformers. In this paper, series-coupling tests are developed and applied for the accurate characterization of the resistive and inductive elements of on-chip silicon-integrated and PWB-integrated prototype transformers. In the series-coupling tests, the various resistive and inductive components simply sum together making transformer characterization more direct and robust than attempting to interpret the short-circuit tests. Experimental results are validated by finite-element simulation.

Published in:

Applied Power Electronics Conference, APEC 2007 - Twenty Second Annual IEEE

Date of Conference:

Feb. 25 2007-March 1 2007