By Topic

Probabilistic Sensor Deployment in Wireless Sensor Network: A New Approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rahman, M.O. ; Dept. of Comput. Eng., Kyung Hee Univ., Seoul ; Razzaque, M.A. ; Choong Seon Hong

Wireless sensor network has the two major tasks: sensing & detecting of any event over a sensing region. Quality of network coverage entirely depends upon the success of these tasks. Network coverage can be degraded after sensor deployment due to sensor's finite energy. So, it is a decisive task to identify those regions of a network where further deployment of sensor is required to improve the quality of network coverage. Exposure is a probabilistic concept and it determines the probability of detecting any event by the sensors. In this paper we proposed a new approach to find out least covered regions in a sensor network where further sensor deployment is desirable. This approach used some graph-theory based algorithm. In order to improve the network coverage the proposed technique of this paper gives a noticeable performance. The experimental output of the proposed approach is a satisfied one for the improvement quality of network coverage. Moreover in case of sensing or detecting, use of closest sensor of a cluster to a particular point of event makes the overall computation less expensive for the proposed technique.

Published in:

Advanced Communication Technology, The 9th International Conference on  (Volume:2 )

Date of Conference:

12-14 Feb. 2007