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Ultra-High Resolution X-Ray CT System with a CdTe Detector

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2 Author(s)
Junpei Yoshitake ; Student Member IEEE, Dept. of Electronic Informatics, Faculty of Eng., Hosei Univ., Tokyo 184-8584, Japan. ; Koichi Ogawa

The development of an X-ray CT system with a room temperature semiconductor detector such as CdTe is a challenging project that would enable us to reconstruct an object with a spatial resolution of less than 100 mum. Moreover the cost of the CdTe detector is relatively cheaper than that of a scintillation detector which is used in a state-of-the-art X-ray CT system. The purpose of this study is to develop an ultra-high resolution X-ray CT system with room temperature semiconductor detector.

Published in:

2006 IEEE Nuclear Science Symposium Conference Record  (Volume:5 )

Date of Conference:

Oct. 29 2006-Nov. 1 2006