By Topic

Simulation Study on an Ultra-High Resolution SPECT with CdTe Detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ogawa, K. ; Dept. of Electron. Informatics, Hosei Univ., Tokyo ; Muraishi, M.

The development of semiconductor detectors such as CdTe and CdZnTe which work at room temperature enables us to realize a new SPECT system. These semiconductor detectors have a high energy resolution. Moreover, they are used as pixelated detectors, and so the intrinsic resolution can be equal to the pixel size used for measurement. The size of a detector pixel is as small as 1 mm, so that the spatial resolution of a reconstructed SPECT image can establish less than 3mm FWHM. To clarify the feasibility of an ultra-high resolution SPECT system, we conducted some simulations and evaluated the image quality.

Published in:

Nuclear Science Symposium Conference Record, 2006. IEEE  (Volume:4 )

Date of Conference:

Oct. 29 2006-Nov. 1 2006