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Reusing a System Testing Process Using with a Model

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3 Author(s)
Furuta, H. ; Mitsubishi Electr. Corp., Hyogo ; Ishihara, A. ; Yamaoka, T.

In this paper, we proposed an approach to permit the development of a testing platform in parallel with application development by accumulating knowledge of a testing platform developed in the past. First, we define a meta-model called the system testing development platform, and describe how to accumulate a testing platform. Then, we show how to find an appropriate testing platform. This helps system architects or application developers get information about testing platforms they are working on. Last, we explain the creation of template testing codes that help application developers concentrate on developing test data.

Published in:

Emerging Technologies and Factory Automation, 2006. ETFA '06. IEEE Conference on

Date of Conference:

20-22 Sept. 2006