Referenced Items are not available for this document.
A novel algorithm UDMDA for parametric yield optimization of IC is proposed in this paper. The algorithm integrates uniform design (UD) and mapping distance. An effective yet simple measurement of uniformity of a set of points, namely k-nearest neighbor, is suggested in the UD. Compared with the available methods, the proposed algorithm does not need any calculation of gradient and assumption of initial point. Furthermore, this algorithm has a high convergence rate and is not sensitive to the size of circuit. Therefore, it can be utilized to optimize the nominal performance as well as improve parametric yield. The efficiency of this algorithm is illustrated with two circuit examples
Published in:
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
(Volume:26
,
Issue:
6
)
Date of Publication: June 2007
- Page(s):
- 1149 - 1155
- ISSN :
- 0278-0070
- INSPEC Accession Number:
- 9433011
- Digital Object Identifier :
- 10.1109/TCAD.2006.885833
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 30 April 2007
- Issue Date :
- June 2007
- Sponsored by :
- IEEE Council on Electronic Design Automation
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