By Topic

Generalized PWM–VSI Control Algorithm Based on a Universal Duty-Cycle Expression: Theoretical Analysis, Simulation Results, and Experimental Validations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Cataliotti, A. ; Dipt. di Ingegneria Elettrica Elettronica e delle Telecomunicazioni, Palermo Univ. ; Genduso, F. ; Raciti, A. ; Galluzzo, G.R.

This paper presents a new approach in realizing various carrier-based pulsewidth-modulation techniques by a generalized control algorithm, which is referred to as the universal control algorithm and is obtained via unequal sharing of null states. The flexibility of such an approach allows one to easily and quickly control two-level inverters. Furthermore, this approach may be also extended with few changes to the control of multilevel inverters. The algorithm that is presented here for two-level voltage-source inverters (VSIs) also obtains efficient detection and management of both the linear and overmodulation ranges. In the overmodulation range, which is treated by using the alpha-beta components of the reference-voltage space vector, the algorithm shows the advantage of lower calculation time, thus allowing one, if required, to increase the switching frequency. Several simulation runs have been performed, aiming to test the proposed procedure for both two-level and multilevel VSIs. Finally, the new algorithm was experimentally validated in the case of two-level inverters by using it in a VSI workbench that can carry out several experimental tests

Published in:

Industrial Electronics, IEEE Transactions on  (Volume:54 ,  Issue: 3 )