Cart (Loading....) | Create Account
Close category search window
 

Spin-Polarized Transport in II–VI Magnetic Resonant-Tunneling Devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)

This paper investigates electronic transport through II-VI semiconductor resonant-tunneling structures containing diluted magnetic impurities. Due to the exchange interaction between the conduction electrons and the impurities, there arises a giant Zeeman splitting in the presence of a moderately low magnetic field. As a consequence, when the quantum well is magnetically doped, the current-voltage characteristics show two peaks corresponding to transport for each spin channel. This behavior is experimentally observed and can be reproduced with a simple tunneling model. The model thus allows to analyze other configurations. First, the magnetic field was further increased, which leads to a spin polarization of the electronic current injected from the leads, thus giving rise to a relative change in the current amplitude. The authors demonstrate that the spin polarization in the emitter can be determined from such a change. Furthermore, in the case of an injector with magnetic impurities, the model shows a large increase in peak amplitude accompanied by a shift of the resonance to higher voltages with increasing fields. It was found that this effect arises from a combination of 3D incident distribution, giant Zeeman splitting, and broad resonance linewidth

Published in:

Electron Devices, IEEE Transactions on  (Volume:54 ,  Issue: 5 )

Date of Publication:

May 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.