Cart (Loading....) | Create Account
Close category search window

Causes and Effects of Kiln Tire Problems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bowen, Alan E. ; Coplay Cement Company, Easton Road, Nazareth, PA 18064. ; Saxer, Benno

The stresses are discussed to which the riding rings of rotary kilns are subjected. These stresses are caused partly by forces acting on the rings and partly by thermal gradients. By nature the stresses are static and dynamic. Particular attention is paid to the Hertzian pressure which must be regarded as the most significant load factor because, apart from surface stresses, other stresses are produced slightly below the surface. These stresses and the corresponding strengths were investigated statistically, based on 125 riding rings, the results being illustrated graphically. Referring to the fracture pattern of a spectacular case of riding ring breakage, the factors that caused it and the mechanism of failure are explained. Hints are given on how to dimension riding rings reasonably.

Published in:

Industry Applications, IEEE Transactions on  (Volume:IA-21 ,  Issue: 2 )

Date of Publication:

March 1985

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.