Cart (Loading....) | Create Account
Close category search window

Multipactor in a Waveguide Iris

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Udiljak, R. ; Dept. of Radio & Space Sci., Chalmers Univ. of Technol., Goteborg ; Anderson, D. ; Lisak, M. ; Puech, J.
more authors

Microwave discharge in vacuum in a waveguide iris is analyzed under the approximation of a uniform electric field over the finite width of the iris. The analysis shows that the random electron drift due to the initial velocity of the secondary electrons leads to a significantly increased multipactor threshold as compared to the result predicted by the (infinitely wide) parallel plate configuration. This increase is determined by the value of the iris height-to-length ratio. For each fixed value of this ratio, the multipactor susceptibility charts can be generated in the traditional engineering units. An increase in this ratio results in a similar shrinkage of each of the multipactor resonance zones. Within each particular zone, the effect is more pronounced for the lower RF frequencies due to the longer transit time between the walls of the iris

Published in:

Plasma Science, IEEE Transactions on  (Volume:35 ,  Issue: 2 )

Date of Publication:

April 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.