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DFT and Test: Ensuring Product Quality

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1 Author(s)

Once design changes are made for DFM/DFY, it is necessary to quantify their impact so that knowledge about yield contribution of different features can be fed back to design and DFM tools.Test presents an opportunity to close the loop by crafting test patterns to expose the defect prone features during automatic test pattern generation (ATPG) and by analyzing silicon failures through diagnosis to determine the features that are actually causing yield loss and their relative impact.

Published in:

Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on

Date of Conference:

March 2007