By Topic

Analysis of Waveguide Discontinuities by a Fourth-Order Finite-Difference Reflective Scheme

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hua Zhang ; Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont. ; Qingyi Guo ; Huang, Wei-Ping

A highly accurate reflective scheme is developed for analysis of two-dimensional (2-D) waveguide discontinuities by using the fourth-order finite-difference (FD) formula. It is demonstrated that the new method achieves a significantly higher accuracy/computation cost ratio in comparison with the conventional FD method. Furthermore, the advantage of the new method is more pronounced for the case of high-index-contrast structures with small feature sizes

Published in:

Lightwave Technology, Journal of  (Volume:25 ,  Issue: 2 )